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Infrared Characterization of Interfacial Si−O Bond Formation on Silanized Flat SiO2/Si Surfaces | Langmuir
Si Wafer with SiO2 Layer - Product Detail - Latech - Singapore Leading Lab Consumable Supplier
Molecular dynamics simulations on the oxidation of Si(100)/SiO2 interface: Emissions and incorporations of Si‐related species into the SiO2 and substrate - Takahashi - 2014 - physica status solidi (b) - Wiley Online Library